The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...

How exhaustive static analysis overcomes the limitations of traditional tests and static-analysis tools. How exhaustive static analysis identifies a buffer overflow by using code samples. How hardware ...

In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

To manage the challenges of today’s complex electrical power systems and tightening budgets, facility managers need to understand the critical connection between electrical commissioning and ...

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...