If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

MEMS (Micro-Electro-Mechanical Systems, MEMS) probe card with the optimized structure and is an ideal to support fine-pitch and high-pin count test requirements. The Virgo Prima MEMS micro-cantilever ...

FormFactor (FORM) is a $2.5 billion OEM of automated wafer probe cards and other testing devices used in the back-end portion of the semiconductor manufacturing process. FORM serves the requirements ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of ...

Slessor explained that probe-card demand is influenced by new design releases and associated wafer volumes, with low PC and ...