Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

Fig. 2: Number of sites per test insertion, by industry and device type. Source: Teradyne In parallel test, every effort is made to minimize ATE and associated test hardware differences between each ...

Since 1998, 32-DUT in-parallel testing has become the standard in the DRAM industry. An example of a 64-DUT in-parallel probe card is shown in Figure 1 (right).

If running the tests in parallel reduces the testing time for each build down to 30 minutes as discussed above, testing sixty builds in a day may instead take only 1800 minutes of server time.

Keysight’s new P9002A parallel parametric test system delivers the following key customer benefits: Ability to add options based on test requirements, with license structure for cost effective ...

We performed a microsimulation of a cohort of 100,000 patients with stage IV nonsquamous NSCLC and showed that parallel testing for genetic aberrations is cost-effective compared with sequential ...