The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...

The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

The JEOL 2100 STEM has energy-dispersive x-ray microanalysis (Bruker), electron energy loss spectroscopy (Gatan EELS) and energy selective imaging (ESI Gatan GIF). All electron microscopes are covered ...

grant by NSF in Summer 2014 to purchase a new electron microprobe, a JEOL JXA-8230 equipped with LaB6 electron gun (PIs K.H. Mahan, J.M. Allaz, and G.L. Farmer). This new instrument will replace the ...

The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer ... Our new NSF-funded field-emission EPMA (JEOL JXA iHP200F) was the first to be installed in the U.S. and is equipped with 5 WDS ...

JEOL's electron beam metal AM machine can now efficiently and cleanly produce lighter parts used in the aerospace and energy industries. Combining multiple parts, reducing weight, and providing high ...

Collectively with JEOL’s special additive manufacturing technology, innovation in additive manufacturing is progressing at an unparalleled speed. The electron beam metal AM machine from JEOL makes it ...