SAN JOSE, Calif. — IC nanoprobing equipment vendor Multiprobe Inc. (Santa Barbara, Calif.) has added PicoCurrent imaging to it Multiscan Atomic Force Probe. According to the company, PicoCurrent ...

Fault localization uses up the most time “As a first step, we conducted surveys among developers to find out what the biggest time wasters are when debugging. It turned out that the actual bug ...

On Sunday, in Xinwang village, Mohuan township, Longyou county, the State Grid Quzhou Power Supply Company energized the province's first pole-mounted intelligent drop-out fuse on a rural distribution ...

Abhik Roychoudhury EETimes (8/26/2012 3:16 PM EDT) Editor’s Note: In the third in a four part series Abhik Roychoudhury, author of Embedded Systems and software validation, discusses the pros and ...

Moreover, establishing some sort of strict synchronization between recording instruments and internal fault detection is not always possible, with the result that data collected at the inputs/outputs ...

In addition, advancements in scanning electron microscopy (SEM) technology are discussed, particularly using Panorama Mode in Coxem SEMs for complete fault localization and characterization. Optical ...