The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these ...

A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. Abstract “Scan-based ...