Atomic force microscopy (AFM) has become an indispensable tool for unravelling the atomic-scale structure and functionality of titanium dioxide (TiO₂) surfaces. The oxide exists in polymorphic ...

Understanding the interaction between light and matter at the smallest scales (angstrom scale) is essential for advancing technology and materials science. Atomic-scale structures, such as defects in ...

Atomic force microscopy (AFM) has emerged as an indispensable tool for probing mechanical properties at the nanometre scale. By monitoring the deflection and vibration of a microfabricated cantilever ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Thought LeaderDr. George HeathUniversity Academic FellowUniversity of Leeds In this interview, AZoNano speaks with Dr. George Heath from the University of Leeds, UK, about the fundamental principles ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...

Neurological disorders are becoming an increasingly significant societal burden, highlighting the critical need for improved diagnostic and therapeutic approaches. Atomic force microscopy (AFM), known ...

In this infographic, we dive into how atomic force microscopy (AFM) works, the technical features one must consider and how it can be implemented for biomechanical investigation. AFM provides ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Scattering near-field optical microscopy with ultralow tip oscillation amplitudes. Credit: Takashi Kumagai Understanding the interaction between light and matter at the smallest scales (angstrom scale ...