Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM ... a postdoctoral researcher in ORNL's Data Nanoanalytics ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...

Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) surface characterization, this ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale ...

Scientists have cracked open a mysterious layer inside batteries, using cutting-edge 3D atomic force microscopy to capture the dynamic molecular structures at their solid-liquid interfaces. These ...

New microscopy technique achieves 1-nanometer resolution for atomic-scale imaging by National Institutes of Natural Sciences edited by Gaby Clark, reviewed by Andrew Zinin Editors' notes ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale imaging and fabrication, enabling both high-resolution surface characterisation and precise nanomachining.

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale.

Rui Shen, Wei Xiong, Xiaoming Lang, Lei Wang, Hekun Guo, Hongtao Zhou, Xiaoyi Zhang, Hang Yang, Quantitative analysis of nano-scale pore structures of broad sense shale oil reservoirs using atomic ...

Atomic force microscopy (AFM) was originally invented for visualizing surfaces with nanoscale resolution. Its basic working principle is to move an ultrathin tip over a sample’s surface.